This new measurement system EVA100 that "Can do what you want, quickly" for the characterization, functional evaluation and mass production evaluations of low pin count analog(*1), mixed signal(*2) and Digital IC(*3) devices.

(∗1): DC-DC Converter or Voltage regulator ICs

(∗2): AD Converter DA Converter ICs

(∗3): MCU or Standard Logic ICs, DFT Test

All necessary functions are integrated into the compact body which has VI sources, Digital and Signal Capture. Testing Units Digital Unit: 220mm (W) × 472mm (D) × 206mm (H) Analog Unit: 363mm (W) × 472mm (D) × 206mm (H)

The Event Master Sequencer (EMS) controls the hardware with high timing accuracy and high precision enabling superior repeatability. Analog VI source, General Control Module and Signal Capture instruments provide versatile and comprehensive measurement capability.

No programming language environment offers very intuitive operation for users, so that everyone from the beginner to expert is able to use the system quickly. Automatic report generation tools reduce the need for additional deskwork, improving the efficiency of evaluation and measurement tasks dramatically.

Stackable Testing Unit architecture supports many scenarios from design to production for analog and Mixed Signal devices. Supporting external instruments, customized measurement systems can also be created according to more specific requirements and needs.

Support characterization, functional evaluation and mass production evaluations efficiently.